Customized wafer level verification methodology: quality risk pre-diagnosis with enhanced screen-ability of stand-by stress-related deteriorations.

Heonsang Lim Jiyoung Yoon Bumgi Lee Jaehee Song Bokyoung Kang Sangho Lee Doh-Soon Kwak Heonsang Lim Ilsang Park Jonghoon Kim Sangwoo Pae Customized wafer level verification methodology: quality risk pre-diagnosis with enhanced screen-ability of stand-by stress-related deteriorations. 1-6 2023 IRPS https://doi.org/10.1109/IRPS48203.2023.10117800 conf/irps/2023 db/conf/irps/irps2023.html#YoonLSKLKLPKP23

Heonsang Lim Optimum Accelerated Degradation Tests for the Gamma Degradation Process Case under the Constraint of Total Cost. 2556-2572 2015 17 Entropy 5 https://doi.org/10.3390/e17052556 db/journals/entropy/entropy17.html#Lim15

Bokyoung Kang Jonghoon Kim Doh-Soon Kwak Bumgi Lee Sangho Lee Sangwoo Pae Ilsang Park Jaehee Song Jiyoung Yoon