A 20-Gb/s/Pin Compact Single-Ended DCC-Less DECS Transceiver With CDR-Less RX Front-End for On-Chip Links.

Sooeun Lee

Jaeyoung Seo Sooeun Lee Myungguk Lee Changjae Moon Byungsub Kim A 20-Gb/s/Pin Compact Single-Ended DCC-Less DECS Transceiver With CDR-Less RX Front-End for On-Chip Links. 3253-3265 2023 November 58 IEEE J. Solid State Circuits 11 https://doi.org/10.1109/JSSC.2023.3287071 db/journals/jssc/jssc58.html#SeoLLMK23

Jaehyun Ko 0001 Iksu Jang Chanho Kim Jihoon Park Changjae Moon Sooeun Lee Byungsub Kim A 50 Mb/s Full HBC TRX with Adaptive DFE and Variable-Interval 3x Oversampling CDR in 28nm CMOS Technology for A 75 cm Body Channel Moving at 0.75 Cycle/sec. 213-216 2022 ESSCIRC https://doi.org/10.1109/ESSCIRC55480.2022.9911296 conf/esscirc/2022 db/conf/esscirc/esscirc2022.html#0001JKPMLK22 Jaeyoung Seo Sooeun Lee Myungguk Lee Changjae Moon Byungsub Kim A 20-Gb/s/pin 0.0024-mm<sup>2</sup> Single-Ended DECS TRX with CDR-less Self-Slicing/Auto-Deserialization to Improve Tolerance on Duty Cycle Error and RX Supply Noise for DCC/CDR-less Short-Reach Memory Interfaces. 1-3 2022 ISSCC https://doi.org/10.1109/ISSCC42614.2022.9731763 conf/isscc/2022 db/conf/isscc/isscc2022.html#SeoLLMK22

Sooeun Lee Jaeyoung Seo Changyoon Han Jae-Yoon Sim Hong-June Park Byungsub Kim A DFE-Enhanced Phase-Difference Modulation Signaling for Multi-Drop Memory Interfaces. 1862-1866 2021 68 IEEE Trans. Circuits Syst. II Express Briefs 6 https://doi.org/10.1109/TCSII.2020.3042209 db/journals/tcasII/tcasII68.html#LeeSHSPK21

Sooeun Lee Jaeyoung Seo Kyunghyun Lim Jahyun Koo 0001 Jae-Yoon Sim Hong-June Park Byungsub Kim A 7.8 Gb/s/pin, 1.96 pJ/b Transceiver With Phase-Difference-Modulation Signaling for Highly Reflective Interconnects. 2114-2127 2020 67-I IEEE Trans. Circuits Syst. I Regul. Pap. 6 https://doi.org/10.1109/TCSI.2020.2969472 db/journals/tcas/tcasI67.html#LeeSLKSPK20

Jaeyoung Seo Jaehyun Ko 0001 Kyunghyun Lim Sooeun Lee Jae-Yoon Sim Hong-June Park Byungsub Kim A 7.8-Gb/s 2.9-pJ/b Single-Ended Receiver With 20-Tap DFE for Highly Reflective Channels. 818-822 2020 28 IEEE Trans. Very Large Scale Integr. Syst. 3 https://doi.org/10.1109/TVLSI.2019.2955389 db/journals/tvlsi/tvlsi28.html#SeoKLLSPK20

Minsoo Choi 0002 Sooeun Lee Myungguk Lee Ji-Hoon Lee Jae-Yoon Sim Hong-June Park Byungsub Kim An FFE Transmitter Which Automatically and Adaptively Relaxes Impedance Matching. 1780-1792 2018 53 IEEE J. Solid State Circuits 6 https://doi.org/10.1109/JSSC.2018.2808603 https://www.wikidata.org/entity/Q130159296 db/journals/jssc/jssc53.html#ChoiLLLSPK18

Sooeun Lee Jaeyoung Seo Kyunghyun Lim Jaehyun Ko 0001 Jae-Yoon Sim Hong-June Park Byungsub Kim A 7.8Gb/s/pin 1.96pJ/b compact single-ended TRX and CDR with phase-difference modulation for highly reflective memory interfaces. 272-274 2018 ISSCC https://doi.org/10.1109/ISSCC.2018.8310289 conf/isscc/2018 db/conf/isscc/isscc2018.html#LeeSLKSPK18

JaeHyun Seo Sangheon Lee Kwangmin Kim Sooeun Lee Hyunsang Hwang Byungsub Kim Automatic ReRAM SPICE Model Generation From Empirical Data for Fast ReRAM-Circuit Coevaluation. 1821-1830 2017 25 IEEE Trans. Very Large Scale Integr. Syst. 6 https://doi.org/10.1109/TVLSI.2017.2655730 http://doi.ieeecomputersociety.org/10.1109/TVLSI.2017.2655730 db/journals/tvlsi/tvlsi25.html#SeoLKLHK17

Seungho Han Sooeun Lee Minsoo Choi 0002 Jae-Yoon Sim Hong-June Park Byungsub Kim A Coefficient-Error-Robust Feed-Forward Equalizing Transmitter for Eye-Variation and Power Improvement. 1902-1914 2016 51 IEEE J. Solid State Circuits 8 https://doi.org/10.1109/JSSC.2016.2574806 db/journals/jssc/jssc51.html#HanLCSPK16

Sooeun Lee Gunbok Lee Jae-Yoon Sim Hong-June Park Wee Sang Park Byungsub Kim A Sample Reduction Technique by Aliasing Channel Response for Fast Equalizing Transceiver Design. 567-574 2015 ICCAD https://doi.org/10.1109/ICCAD.2015.7372620 http://dl.acm.org/citation.cfm?id=2840898 conf/iccad/2015 db/conf/iccad/iccad2015.html#LeeLSPPK15 Seungho Han Sooeun Lee Minsoo Choi 0002 Jae-Yoon Sim Hong-June Park Byungsub Kim 2.7 A coefficient-error-robust FFE TX with 230% eye-variation improvement without calibration in 65nm CMOS technology. 50-51 2014 ISSCC https://doi.org/10.1109/ISSCC.2014.6757333 conf/isscc/2014 db/conf/isscc/isscc2014.html#HanLCSPK14 Minsoo Choi 0002 Changyoon Han Seungho Han Hyunsang Hwang Iksu Jang Byungsub Kim Chanho Kim Kwangmin Kim Jahyun Koo 0001Jaehyun Ko 0001 Gunbok Lee Jihoon LeeJi-Hoon Lee Myungguk Lee Sangheon Lee Kyunghyun Lim Changjae Moon Hong-June Park Jihoon Park Wee Sang Park JaeHyun Seo Jaeyoung Seo Jae-Yoon Sim