A system for identifying an anti-counterfeiting pattern based on the statistical difference in key image regions.

Fri, 01 Jan 2021 00:00:00 +0100

Zhaohui Zheng, Hong Zheng, Jianping Ju, Deng Chen , Xi Li, Zhongyuan Guo , Changhui You, Mingyu Lin:
A system for identifying an anti-counterfeiting pattern based on the statistical difference in key image regions. Expert Syst. Appl. 183: 115410 (2021)