Massimo Catalano
Rodolfo A. Rodriguez-Davila
Richard A. Chapman
Massimo Catalano
Manuel Quevedo-Lopez
Chadwin D. Young
Enhanced Threshold Voltage Stability in ZnO Thin-Film-Transistors by Excess of Oxygen in Atomic Layer Deposited Al2O3.
1-5
2020
IRPS
https://doi.org/10.1109/IRPS45951.2020.9129345
conf/irps/2020
db/conf/irps/irps2020.html#Rodriguez-Davila20
Richard A. Chapman
Manuel Quevedo-Lopez
Rodolfo A. Rodriguez-Davila
Chadwin D. Young