Development of acceptance sampling plans under time-truncated life test for verifying product reliability using weibull-percentile lifetimes.

Wed, 01 Jan 2025 00:00:00 +0100

Chien-Wei Wu , To-Cheng Wang , Rou-Hui Chen:
Development of acceptance sampling plans under time-truncated life test for verifying product reliability using weibull-percentile lifetimes. Reliab. Eng. Syst. Saf. 261: 111062 (2025)