Developing a failure-censored two-plan sampling system for product reliability validation under the Weibull distribution.

Wed, 01 Jan 2025 00:00:00 +0100

To-Cheng Wang , Chien-Wei Wu , Ming-Hung Shu:
Developing a failure-censored two-plan sampling system for product reliability validation under the Weibull distribution. Adv. Eng. Informatics 67: 103584 (2025)