<?xml version="1.0"?>
<dblpperson name="Chien-Wei Wu" pid="31/5183" n="70">
<person key="homepages/31/5183" mdate="2023-10-03">
<author pid="31/5183">Chien-Wei Wu</author>
<url>https://orcid.org/0000-0001-7965-1997</url>
</person>
<r><article key="journals/candie/LeeWW26" mdate="2025-12-24">
<author pid="44/3998">Amy H. I. Lee</author>
<author pid="272/2687">To-Cheng Wang</author>
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<title>Development of an adaptive inspection scheme for lot disposition in high-yield quality verification.</title>
<pages>111621</pages>
<year>2026</year>
<volume>211</volume>
<journal>Comput. Ind. Eng.</journal>
<ee>https://doi.org/10.1016/j.cie.2025.111621</ee>
<url>db/journals/candie/candie211.html#LeeWW26</url>
<stream>streams/journals/candie</stream>
</article>
</r>
<r><article key="journals/aei/WangWS25" mdate="2025-08-05">
<author orcid="0000-0001-8905-6913" pid="272/2687">To-Cheng Wang</author>
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<author pid="77/3428">Ming-Hung Shu</author>
<title>Developing a failure-censored two-plan sampling system for product reliability validation under the Weibull distribution.</title>
<pages>103584</pages>
<year>2025</year>
<volume>67</volume>
<journal>Adv. Eng. Informatics</journal>
<ee>https://doi.org/10.1016/j.aei.2025.103584</ee>
<url>db/journals/aei/aei67.html#WangWS25</url>
<stream>streams/journals/aei</stream>
</article>
</r>
<r><article key="journals/anor/WuD25" mdate="2025-07-04">
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<author orcid="0000-0001-6763-6992" pid="345/9175">Armin Darmawan</author>
<title>A modified sampling scheme for lot sentencing based on the third-generation capability index.</title>
<pages>25-46</pages>
<year>2025</year>
<month>June</month>
<volume>349</volume>
<journal>Ann. Oper. Res.</journal>
<number>1</number>
<ee>https://doi.org/10.1007/s10479-023-05328-z</ee>
<url>db/journals/anor/anor349.html#WuD25</url>
<stream>streams/journals/anor</stream>
</article>
</r>
<r><article key="journals/anor/WuSW25" mdate="2025-07-04">
<author pid="31/5183">Chien-Wei Wu</author>
<author pid="77/3428">Ming-Hung Shu</author>
<author orcid="0000-0001-8905-6913" pid="272/2687">To-Cheng Wang</author>
<title>An adaptive lot-traceability sampling plan for Weibull distributed lifetime with warranty return rate consideration and a smart information system.</title>
<pages>87-101</pages>
<year>2025</year>
<month>June</month>
<volume>349</volume>
<journal>Ann. Oper. Res.</journal>
<number>1</number>
<ee>https://doi.org/10.1007/s10479-023-05438-8</ee>
<url>db/journals/anor/anor349.html#WuSW25</url>
<stream>streams/journals/anor</stream>
</article>
</r>
<r><article key="journals/anor/WuW25a" mdate="2025-07-04">
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<author orcid="0000-0001-6994-2336" pid="220/1440">Zih-Huei Wang</author>
<title>A cost-effective sampling strategy by variables inspection for lot disposition.</title>
<pages>219-235</pages>
<year>2025</year>
<month>June</month>
<volume>349</volume>
<journal>Ann. Oper. Res.</journal>
<number>1</number>
<ee>https://doi.org/10.1007/s10479-023-05776-7</ee>
<url>db/journals/anor/anor349.html#WuW25a</url>
<stream>streams/journals/anor</stream>
</article>
</r>
<r><article key="journals/candie/WangWW25" mdate="2025-07-04">
<author orcid="0000-0001-8905-6913" pid="272/2687">To-Cheng Wang</author>
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<author pid="407/9782">Hung-Yi Wang</author>
<title>Developing generalized quick-switch sampling systems for high-yield product verification.</title>
<pages>111202</pages>
<year>2025</year>
<volume>206</volume>
<journal>Comput. Ind. Eng.</journal>
<ee>https://doi.org/10.1016/j.cie.2025.111202</ee>
<url>db/journals/candie/candie206.html#WangWW25</url>
<stream>streams/journals/candie</stream>
</article>
</r>
<r><article key="journals/ijpr/WangWL25" mdate="2025-01-25">
<author orcid="0000-0001-6994-2336" pid="220/1440">Zih-Huei Wang</author>
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<author pid="274/3658">Pei-Yi Li</author>
<title>An improved skip-lot sampling scheme with resampling mechanism using an advanced capability index.</title>
<pages>104-118</pages>
<year>2025</year>
<volume>63</volume>
<journal>Int. J. Prod. Res.</journal>
<number>1</number>
<ee>https://doi.org/10.1080/00207543.2024.2357736</ee>
<url>db/journals/ijpr/ijpr63.html#WangWL25</url>
<stream>streams/journals/ijpr</stream>
</article>
</r>
<r><article key="journals/jors/WuDL25" mdate="2025-04-01">
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<author orcid="0000-0001-6763-6992" pid="345/9175">Armin Darmawan</author>
<author orcid="0000-0003-3974-6400" pid="37/10552">Shih-Wen Liu</author>
<title>Developing a stage-independent multiple sampling plan with loss-based capability index for lot disposition.</title>
<pages>426-437</pages>
<year>2025</year>
<month>March</month>
<volume>76</volume>
<journal>J. Oper. Res. Soc.</journal>
<number>3</number>
<ee>https://doi.org/10.1080/01605682.2024.2363264</ee>
<url>db/journals/jors/jors76.html#WuDL25</url>
<stream>streams/journals/jors</stream>
</article>
</r>
<r><article key="journals/or/WuW25" mdate="2025-07-04">
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<author orcid="0000-0001-8905-6913" pid="272/2687">To-Cheng Wang</author>
<title>Development of a cost-effective adaptive sampling system considering process yield and quality loss.</title>
<pages>59</pages>
<year>2025</year>
<month>June</month>
<volume>25</volume>
<journal>Oper. Res.</journal>
<number>2</number>
<ee>https://doi.org/10.1007/s12351-025-00945-x</ee>
<url>db/journals/or/or25.html#WuW25</url>
<stream>streams/journals/or</stream>
</article>
</r>
<r><article key="journals/qre/LiuWW25" mdate="2025-05-01">
<author orcid="0000-0003-3974-6400" pid="37/10552">Shih-Wen Liu</author>
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<author pid="401/4785">I-Ting Wei</author>
<title>Enhancing Lot Sentencing Through a Capability Index-Based Skip-Lot Sampling Scheme.</title>
<pages>1149-1160</pages>
<year>2025</year>
<month>April</month>
<volume>41</volume>
<journal>Qual. Reliab. Eng. Int.</journal>
<number>3</number>
<ee>https://doi.org/10.1002/qre.3712</ee>
<url>db/journals/qre/qre41.html#LiuWW25</url>
<stream>streams/journals/qre</stream>
</article>
</r>
<r><article key="journals/ress/WuWC25" mdate="2025-05-09">
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<author orcid="0000-0001-8905-6913" pid="272/2687">To-Cheng Wang</author>
<author pid="404/3368">Rou-Hui Chen</author>
<title>Development of acceptance sampling plans under time-truncated life test for verifying product reliability using weibull-percentile lifetimes.</title>
<pages>111062</pages>
<year>2025</year>
<volume>261</volume>
<journal>Reliab. Eng. Syst. Saf.</journal>
<ee>https://doi.org/10.1016/j.ress.2025.111062</ee>
<url>db/journals/ress/ress261.html#WuWC25</url>
<stream>streams/journals/ress</stream>
</article>
</r>
<r><article key="journals/aei/WangW24" mdate="2025-07-04">
<author orcid="0000-0001-8905-6913" pid="272/2687">To-Cheng Wang</author>
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<title>Development of a generalised dual sampling system with a flexible decision-rule-transformation mechanism.</title>
<pages>102588</pages>
<year>2024</year>
<volume>62</volume>
<journal>Adv. Eng. Informatics</journal>
<ee>https://doi.org/10.1016/j.aei.2024.102588</ee>
<url>db/journals/aei/aei62.html#WangW24</url>
</article>
</r>
<r><article key="journals/aei/WangW24a" mdate="2025-07-04">
<author orcid="0000-0001-8905-6913" pid="272/2687">To-Cheng Wang</author>
<author pid="31/5183">Chien-Wei Wu</author>
<title>Optimal design of an integrated inspection scheme with two adjustable sampling mechanisms for lot disposition.</title>
<pages>102845</pages>
<year>2024</year>
<volume>62</volume>
<journal>Adv. Eng. Informatics</journal>
<ee>https://doi.org/10.1016/j.aei.2024.102845</ee>
<url>db/journals/aei/aei62.html#WangW24a</url>
<stream>streams/journals/aei</stream>
</article>
</r>
<r><article key="journals/anor/LiuW24" mdate="2024-09-20">
<author orcid="0000-0003-3974-6400" pid="37/10552">Shih-Wen Liu</author>
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<title>An efficient partial sampling inspection for lot sentencing based on process yield.</title>
<pages>325-344</pages>
<year>2024</year>
<month>September</month>
<volume>340</volume>
<journal>Ann. Oper. Res.</journal>
<number>1</number>
<ee>https://doi.org/10.1007/s10479-023-05341-2</ee>
<url>db/journals/anor/anor340.html#LiuW24</url>
<stream>streams/journals/anor</stream>
</article>
</r>
<r><article key="journals/anor/WuDW24" mdate="2024-10-06">
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<author orcid="0000-0001-6763-6992" pid="345/9175">Armin Darmawan</author>
<author pid="384/7885">Nien-Yun Wu</author>
<title>A double sampling plan for truncated life tests under two-parameter Lindley distribution.</title>
<pages>619-641</pages>
<year>2024</year>
<month>September</month>
<volume>340</volume>
<journal>Ann. Oper. Res.</journal>
<number>1</number>
<ee>https://doi.org/10.1007/s10479-024-05955-0</ee>
<url>db/journals/anor/anor340.html#WuDW24</url>
<stream>streams/journals/anor</stream>
</article>
</r>
<r><article key="journals/qre/WuDWL24" mdate="2024-10-06">
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<author orcid="0000-0001-6763-6992" pid="345/9175">Armin Darmawan</author>
<author orcid="0000-0001-6994-2336" pid="220/1440">Zih-Huei Wang</author>
<author pid="385/7827">Meng-Tzu Lin</author>
<title>Assessing high-quality process performance using the quality-yield index: An innovative methodology.</title>
<pages>3407-3421</pages>
<year>2024</year>
<month>October</month>
<volume>40</volume>
<journal>Qual. Reliab. Eng. Int.</journal>
<number>6</number>
<ee>https://doi.org/10.1002/qre.3576</ee>
<url>db/journals/qre/qre40.html#WuDWL24</url>
<stream>streams/journals/qre</stream>
</article>
</r>
<r><article key="journals/ress/LeeWWK24" mdate="2024-02-29">
<author pid="44/3998">Amy H. I. Lee</author>
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<author orcid="0000-0001-8905-6913" pid="272/2687">To-Cheng Wang</author>
<author pid="367/8552">Ming-Han Kuo</author>
<title>Construction of acceptance sampling schemes for exponential lifetime products with progressive type II right censoring.</title>
<pages>109843</pages>
<year>2024</year>
<month>March</month>
<volume>243</volume>
<journal>Reliab. Eng. Syst. Saf.</journal>
<ee>https://doi.org/10.1016/j.ress.2023.109843</ee>
<url>db/journals/ress/ress243.html#LeeWWK24</url>
</article>
</r>
<r><article key="journals/ijpr/WuDL23" mdate="2023-09-30">
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<author orcid="0000-0001-6763-6992" pid="345/9175">Armin Darmawan</author>
<author orcid="0000-0003-3974-6400" pid="37/10552">Shih-Wen Liu</author>
<title>Stage-independent multiple sampling plan by variables inspection for lot determination based on the process capability index <i>C<sub>pk</sub></i>.</title>
<pages>3171-3183</pages>
<year>2023</year>
<month>May</month>
<volume>61</volume>
<journal>Int. J. Prod. Res.</journal>
<number>10</number>
<ee>https://doi.org/10.1080/00207543.2022.2078745</ee>
<url>db/journals/ijpr/ijpr61.html#WuDL23</url>
</article>
</r>
<r><article key="journals/anor/WangWS22" mdate="2022-04-09">
<author orcid="0000-0001-8905-6913" pid="272/2687">To-Cheng Wang</author>
<author pid="31/5183">Chien-Wei Wu</author>
<author orcid="0000-0001-5866-6700" pid="77/3428">Ming-Hung Shu</author>
<title>A variables-type multiple-dependent-state sampling plan based on the lifetime performance index under a Weibull distribution.</title>
<pages>381-399</pages>
<year>2022</year>
<volume>311</volume>
<journal>Ann. Oper. Res.</journal>
<number>1</number>
<ee>https://doi.org/10.1007/s10479-020-03655-z</ee>
<url>db/journals/anor/anor311.html#WangWS22</url>
</article>
</r>
<r><article key="journals/ijpr/WuLH22" mdate="2022-06-15">
<author pid="31/5183">Chien-Wei Wu</author>
<author pid="44/3998">Amy H. I. Lee</author>
<author pid="312/5873">Yi-San Huang</author>
<title>Developing a skip-lot sampling scheme by variables inspection using repetitive sampling as a reference plan.</title>
<pages>3018-3030</pages>
<year>2022</year>
<volume>60</volume>
<journal>Int. J. Prod. Res.</journal>
<number>10</number>
<ee>https://doi.org/10.1080/00207543.2021.1909768</ee>
<url>db/journals/ijpr/ijpr60.html#WuLH22</url>
</article>
</r>
<r><article key="journals/jors/WuCL22" mdate="2022-12-05">
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<author orcid="0000-0002-4972-2050" pid="151/7672">Jr-Tzung Chen</author>
<author orcid="0000-0003-3974-6400" pid="37/10552">Shih-Wen Liu</author>
<title>Designing a yield-based skip-lot sampling plan for lot acceptance determination.</title>
<pages>653-663</pages>
<year>2022</year>
<volume>73</volume>
<journal>J. Oper. Res. Soc.</journal>
<number>3</number>
<ee>https://doi.org/10.1080/01605682.2020.1854630</ee>
<url>db/journals/jors/jors73.html#WuCL22</url>
</article>
</r>
<r><article key="journals/jors/WuSHH22" mdate="2023-01-31">
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<author orcid="0000-0001-5866-6700" pid="77/3428">Ming-Hung Shu</author>
<author pid="152/0789">Ting-Ying Huang</author>
<author orcid="0000-0002-8484-5056" pid="79/182">Bi-Min Hsu</author>
<title>Comparisons of frequentist and Bayesian inferences for interval estimation on process yield.</title>
<pages>2694-2705</pages>
<year>2022</year>
<volume>73</volume>
<journal>J. Oper. Res. Soc.</journal>
<number>12</number>
<ee>https://doi.org/10.1080/01605682.2021.2015253</ee>
<url>db/journals/jors/jors73.html#WuSHH22</url>
</article>
</r>
<r><article key="journals/qre/WuLL22" mdate="2022-06-02">
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<author pid="44/3998">Amy H. I. Lee</author>
<author orcid="0000-0003-3974-6400" pid="37/10552">Shih-Wen Liu</author>
<title>A repetitive group sampling plan based on the lifetime performance index under gamma distribution.</title>
<pages>2049-2064</pages>
<year>2022</year>
<volume>38</volume>
<journal>Qual. Reliab. Eng. Int.</journal>
<number>4</number>
<ee>https://doi.org/10.1002/qre.3060</ee>
<url>db/journals/qre/qre38.html#WuLL22</url>
</article>
</r>
<r><article key="journals/qre/LiuW22" mdate="2022-10-18">
<author orcid="0000-0003-3974-6400" pid="37/10552">Shih-Wen Liu</author>
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<title>Yield-based variables repetitive group plan with a critical-value-adjusted mechanism.</title>
<pages>3017-3032</pages>
<year>2022</year>
<volume>38</volume>
<journal>Qual. Reliab. Eng. Int.</journal>
<number>6</number>
<ee>https://doi.org/10.1002/qre.3004</ee>
<url>db/journals/qre/qre38.html#LiuW22</url>
</article>
</r>
<r><article key="journals/qre/WangWL22" mdate="2022-10-18">
<author orcid="0000-0001-6994-2336" pid="220/1440">Zih-Huei Wang</author>
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<author pid="175/2860">Wei-Ren Lin</author>
<title>Developing a variables modified chain sampling plan with Taguchi capability index.</title>
<pages>3051-3061</pages>
<year>2022</year>
<volume>38</volume>
<journal>Qual. Reliab. Eng. Int.</journal>
<number>6</number>
<ee>https://doi.org/10.1002/qre.3024</ee>
<url>db/journals/qre/qre38.html#WangWL22</url>
</article>
</r>
<r><article key="journals/candie/WangW21" mdate="2021-09-24">
<author pid="220/1440">Zih-Huei Wang</author>
<author pid="31/5183">Chien-Wei Wu</author>
<title>Design and construction of a variables quick switching sampling system based on Taguchi capability index.</title>
<pages>107582</pages>
<year>2021</year>
<volume>160</volume>
<journal>Comput. Ind. Eng.</journal>
<ee>https://doi.org/10.1016/j.cie.2021.107582</ee>
<url>db/journals/candie/candie160.html#WangW21</url>
</article>
</r>
<r><article key="journals/cstat/WuSWH21" mdate="2021-06-01">
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<author orcid="0000-0001-5866-6700" pid="77/3428">Ming-Hung Shu</author>
<author pid="293/0648">Pei-An Wang</author>
<author orcid="0000-0002-8484-5056" pid="79/182">Bi-Min Hsu</author>
<title>Variables skip-lot sampling plans on the basis of process capability index for products with a low fraction of defectives.</title>
<pages>1391-1413</pages>
<year>2021</year>
<volume>36</volume>
<journal>Comput. Stat.</journal>
<number>2</number>
<ee>https://doi.org/10.1007/s00180-020-01049-0</ee>
<url>db/journals/cstat/cstat36.html#WuSWH21</url>
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</r>
<r><article key="journals/ijpr/WuLH21" mdate="2022-02-08">
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<author pid="44/3998">Amy H. I. Lee</author>
<author pid="312/5873">Yi-San Huang</author>
<title>A variable-type skip-lot sampling plan for products with a unilateral specification limit.</title>
<pages>4140-4156</pages>
<year>2021</year>
<volume>59</volume>
<journal>Int. J. Prod. Res.</journal>
<number>14</number>
<ee>https://doi.org/10.1080/00207543.2020.1757778</ee>
<url>db/journals/ijpr/ijpr59.html#WuLH21</url>
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</r>
<r><article key="journals/jors/WuC21" mdate="2025-01-19">
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<author pid="151/7672">Jr-Tzung Chen</author>
<title>A modified sampling plan by variables with an adjustable mechanism for lot sentencing.</title>
<pages>678-687</pages>
<year>2021</year>
<volume>72</volume>
<journal>J. Oper. Res. Soc.</journal>
<number>3</number>
<ee>https://doi.org/10.1080/01605682.2019.1657366</ee>
<ee>https://www.wikidata.org/entity/Q127283032</ee>
<url>db/journals/jors/jors72.html#WuC21</url>
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</r>
<r><article key="journals/qre/WangWHS21" mdate="2021-03-02">
<author orcid="0000-0001-8905-6913" pid="272/2687">To-Cheng Wang</author>
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<author pid="79/182">Bi-Min Hsu</author>
<author orcid="0000-0001-5866-6700" pid="77/3428">Ming-Hung Shu</author>
<title>Process-capability-qualified adjustable multiple-dependent-state sampling plan for a long-term supplier-buyer relationship.</title>
<pages>583-597</pages>
<year>2021</year>
<volume>37</volume>
<journal>Qual. Reliab. Eng. Int.</journal>
<number>2</number>
<ee>https://doi.org/10.1002/qre.2750</ee>
<url>db/journals/qre/qre37.html#WangWHS21</url>
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</r>
<r><article key="journals/nca/LiaoW20" mdate="2025-01-19">
<author orcid="0000-0002-8351-4271" pid="60/7297">Mou-Yuan Liao</author>
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<title>Supplier selection based on normal process yield: the Bayesian inference.</title>
<pages>4121-4133</pages>
<year>2020</year>
<volume>32</volume>
<journal>Neural Comput. Appl.</journal>
<number>8</number>
<ee>https://doi.org/10.1007/s00521-018-3718-4</ee>
<ee>https://www.wikidata.org/entity/Q129250262</ee>
<url>db/journals/nca/nca32.html#LiaoW20</url>
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<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<title>On the Sampling Distributions of the Estimated Process Loss Indices with Asymmetric Tolerances.</title>
<pages>1153-1170</pages>
<year>2007</year>
<volume>36</volume>
<journal>Commun. Stat. Simul. Comput.</journal>
<number>6</number>
<ee>https://doi.org/10.1080/03610910701569168</ee>
<url>db/journals/cssc/cssc36.html#ChangPW07</url>
</article>
</r>
<r><article key="journals/eor/PearnW06" mdate="2020-02-21">
<author pid="27/6335">Wen Lea Pearn</author>
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<title>Production quality and yield assurance for processes with multiple independent characteristics.</title>
<pages>637-647</pages>
<year>2006</year>
<volume>173</volume>
<journal>Eur. J. Oper. Res.</journal>
<number>2</number>
<ee>https://doi.org/10.1016/j.ejor.2005.02.050</ee>
<url>db/journals/eor/eor173.html#PearnW06</url>
</article>
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<r><article key="journals/ijsysc/PearnCW06" mdate="2020-07-22">
<author pid="27/6335">Wen Lea Pearn</author>
<author pid="73/1439">Y. C. Chang</author>
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<title>Multiple-process performance analysis chart based on process loss indices.</title>
<pages>429-435</pages>
<year>2006</year>
<volume>37</volume>
<journal>Int. J. Syst. Sci.</journal>
<number>7</number>
<ee>https://doi.org/10.1080/00207720600566263</ee>
<url>db/journals/ijsysc/ijsysc37.html#PearnCW06</url>
</article>
</r>
<r><article key="journals/jors/PearnW06" mdate="2020-09-18">
<author pid="27/6335">Wen Lea Pearn</author>
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<title>Variables sampling plans with PPM fraction of defectives and process loss consideration.</title>
<pages>450-459</pages>
<year>2006</year>
<volume>57</volume>
<journal>J. Oper. Res. Soc.</journal>
<number>4</number>
<ee>https://doi.org/10.1057/palgrave.jors.2602013</ee>
<url>db/journals/jors/jors57.html#PearnW06</url>
</article>
</r>
<r><article key="journals/eor/PearnW05" mdate="2020-02-21">
<author pid="27/6335">Wen Lea Pearn</author>
<author orcid="0000-0001-7965-1997" pid="31/5183">Chien-Wei Wu</author>
<title>A Bayesian approach for assessing process precision based on multiple samples.</title>
<pages>685-695</pages>
<year>2005</year>
<volume>165</volume>
<journal>Eur. J. Oper. Res.</journal>
<number>3</number>
<ee>https://doi.org/10.1016/j.ejor.2004.02.009</ee>
<url>db/journals/eor/eor165.html#PearnW05</url>
</article>
</r>
<coauthors n="61" nc="5">
<co c="1"><na f="a/Al=Refaie:Abbas" pid="53/69">Abbas Al-Refaie</na></co>
<co c="4"><na f="a/Aslam_0002:Muhammad" pid="47/3349-2">Muhammad Aslam 0002</na></co>
<co c="0"><na f="b/Barth=egrave=s:Jean=Paul_A=" pid="b/JeanPaulABarthes">Jean-Paul A. Barth&#232;s</na></co>
<co c="0"><na f="c/Chang:C=_S=" pid="53/5178">C. S. Chang</na></co>
<co c="1"><na f="c/Chang:Chin=Chih" pid="49/391">Chin-Chih Chang</na></co>
<co c="0"><na f="c/Chang:Kuo=Hao" pid="37/130">Kuo-Hao Chang</na></co>
<co c="0"><na f="c/Chang:Y=_C=" pid="73/1439">Y. C. Chang</na></co>
<co c="0"><na f="c/Chen:H=_C=" pid="59/6257">H. C. Chen</na></co>
<co c="3"><na f="c/Chen:James_C=" pid="14/3198">James C. Chen</na></co>
<co c="0"><na f="c/Chen:Jr=Tzung" pid="151/7672">Jr-Tzung Chen</na></co>
<co c="0"><na f="c/Chen:Rou=Hui" pid="404/3368">Rou-Hui Chen</na></co>
<co c="0"><na f="c/Chen:Yen=Wen" pid="26/2646">Yen-Wen Chen</na></co>
<co c="0"><na f="c/Cheng:Feng=Tsung" pid="62/7817">Feng-Tsung Cheng</na></co>
<co c="2"><na f="c/Chuang:Cheng=Ju" pid="130/9923">Cheng-Ju Chuang</na></co>
<co c="0"><na f="d/Darmawan:Armin" pid="345/9175">Armin Darmawan</na></co>
<co c="2"><na f="h/Ho:Chia=Huei" pid="82/1889">Chia-Huei Ho</na></co>
<co c="0"><na f="h/Hou:Jiang=Liang" pid="12/3430">Jiang-Liang Hou</na></co>
<co c="0"><na f="h/Hsu:Bi=Min" pid="79/182">Bi-Min Hsu</na></co>
<co c="0"><na f="h/Huang:Ting=Ying" pid="152/0789">Ting-Ying Huang</na></co>
<co c="0"><na f="h/Huang:Yi=San" pid="312/5873">Yi-San Huang</na></co>
<co c="4"><na f="j/Jun:Chi=Hyuck" pid="37/5898">Chi-Hyuck Jun</na></co>
<co c="0"><na f="k/Kang:He=Yau" pid="21/5788">He-Yau Kang</na></co>
<co c="0"><na f="k/Kuo:Ming=Han" pid="367/8552">Ming-Han Kuo</na></co>
<co c="0"><na f="k/Kurniati:Nani" pid="159/8428">Nani Kurniati</na></co>
<co c="0"><na f="l/Lahoti:Geet" pid="209/0052">Geet Lahoti</na></co>
<co c="0" n="2"><na f="l/Lee:Amy_Hsin=I" pid="44/3998">Amy Hsin-I Lee</na><na>Amy H. I. Lee</na></co>
<co c="0"><na f="l/Lee:Cheng=Han" pid="57/8056">Cheng-Han Lee</na></co>
<co c="0" n="2"><na f="l/Li:Peiyi" pid="274/3658">Peiyi Li</na><na>Pei-Yi Li</na></co>
<co c="0"><na f="l/Liao:Chung=Shou" pid="72/3143">Chung-Shou Liao</na></co>
<co c="0"><na f="l/Liao:Mou=Yuan" pid="60/7297">Mou-Yuan Liao</na></co>
<co c="0"><na f="l/Lin:Chien=Hua" pid="84/3036">Chien-Hua Lin</na></co>
<co c="0"><na f="l/Lin:Chung=Yang" pid="148/0519">Chung-Yang Lin</na></co>
<co c="0"><na f="l/Lin:Meng=Tzu" pid="385/7827">Meng-Tzu Lin</na></co>
<co c="0"><na f="l/Lin:Wei=Ren" pid="175/2860">Wei-Ren Lin</na></co>
<co c="0"><na f="l/Liu:Shih=Wen" pid="37/10552">Shih-Wen Liu</na></co>
<co c="0"><na f="l/Liu:Shizhen" pid="41/9772">Shizhen Liu</na></co>
<co c="0"><na f="l/Luo:Junzhou" pid="l/JunzhouLuo">Junzhou Luo</na></co>
<co c="0"><na f="n/Nugroho:Alexander_A=" pid="159/8556">Alexander A. Nugroho</na></co>
<co c="2"><na f="o/Ouyang:Liang=Yuh" pid="30/652">Liang-Yuh Ouyang</na></co>
<co c="0"><na f="p/Pearn:Wen_Lea" pid="27/6335">Wen Lea Pearn</na></co>
<co c="0"><na f="q/Qian:Zhen" pid="57/3834">Zhen Qian</na></co>
<co c="3"><na f="r/Rakhmawati:Dwi_Yuli" pid="177/0117">Dwi Yuli Rakhmawati</na></co>
<co c="1"><na f="s/Sawalheh:Moaath" pid="248/6474">Moaath Sawalheh</na></co>
<co c="0"><na f="s/Shen_0001:Weiming" pid="s/WeimingShen">Weiming Shen 0001</na></co>
<co c="0"><na f="s/Shu:Ming=Hung" pid="77/3428">Ming-Hung Shu</na></co>
<co c="0" n="2"><na f="t/Tai:Yu_Ting" pid="72/8288">Yu Ting Tai</na><na>Y. T. Tai</na></co>
<co c="0"><na f="t/Trappey:Amy_J=_C=" pid="86/1526">Amy J. C. Trappey</na></co>
<co c="0" n="2"><na f="v/Vannan:Mani_A=" pid="220/1413">Mani A. Vannan</na><na>Mani Vannan</na></co>
<co c="0"><na f="w/Wang_0001:Ben" pid="53/5843-1">Ben Wang 0001</na></co>
<co c="0"><na f="w/Wang:Hung=Yi" pid="407/9782">Hung-Yi Wang</na></co>
<co c="0"><na f="w/Wang_0001:Kan" pid="98/8683">Kan Wang 0001</na></co>
<co c="0"><na f="w/Wang:Pei=An" pid="293/0648">Pei-An Wang</na></co>
<co c="0"><na f="w/Wang:To=Cheng" pid="272/2687">To-Cheng Wang</na></co>
<co c="0" n="2"><na f="w/Wang:Zih_Huei" pid="220/1440">Zih Huei Wang</na><na>Zih-Huei Wang</na></co>
<co c="0"><na f="w/Wei:I=Ting" pid="401/4785">I-Ting Wei</na></co>
<co c="0" n="2"><na f="w/Wu:Jiawei" pid="37/10763">Jiawei Wu</na><na>Jia-Wei Wu</na></co>
<co c="0"><na f="w/Wu:Nien=Yun" pid="384/7885">Nien-Yun Wu</na></co>
<co c="1"><na f="w/Wu:Tai=Hsi" pid="38/3584">Tai-Hsi Wu</na></co>
<co c="3"><na f="y/Yang:Chao=Lung" pid="67/4969">Chao-Lung Yang</na></co>
<co c="0"><na f="y/Yang:Chienhui" pid="64/5283">Chienhui Yang</na></co>
<co c="0"><na f="z/Zhang:Chuck" pid="36/1391">Chuck Zhang</na></co>
</coauthors>
</dblpperson>

