Effective design-for-testability techniques for H.264 all-binary integer motion estimation.

Bo-Yuan Ye

Po-Yu Yeh Bo-Yuan Ye Sy-Yen Kuo Ing-Yi Chen Effective design-for-testability techniques for H.264 all-binary integer motion estimation. 403-413 2010 4 IET Circuits Devices Syst. 5 https://doi.org/10.1049/iet-cds.2009.0353 db/journals/iet-cds/iet-cds4.html#YehYKC10

Bo-Yuan Ye Po-Yu Yeh Sy-Yen Kuo Ing-Yi Chen Scalable and bijective cells for C-testable iterative logic array architectures. 172-181 2009 3 IET Circuits Devices Syst. 4 https://doi.org/10.1049/iet-cds.2008.0296 https://www.wikidata.org/entity/Q114106171 db/journals/iet-cds/iet-cds3.html#YeYKC09

Bo-Yuan Ye Po-Yu Yeh Sy-Yen Kuo Ing-Yi Chen Design-for-testability techniques for CORDIC design. 1436-1440 2009 40 Microelectron. J. 10 https://doi.org/10.1016/j.mejo.2009.06.002 db/journals/mj/mj40.html#YeYKC09

Wen-Jyi Hwang Bo-Yuan Ye Chin-Tsai Lin A novel competitive learning algorithm for the parametric classification with Gaussian distributions. 375-380 2000 21 Pattern Recognit. Lett. 5 https://doi.org/10.1016/S0167-8655(00)00004-0 db/journals/prl/prl21.html#HwangYL00

Wen-Jyi Hwang Bo-Yuan Ye Shi-Chiang Liao A novel entropy-constrained competitive learning algorithm for vector quantization. 133-147 1999 25 Neurocomputing 1-3 https://doi.org/10.1016/S0925-2312(99)00058-2 db/journals/ijon/ijon25.html#HwangYL99

Wen-Jyi Hwang Bo-Yuan Ye Lin-Ying Lai Nonparametric classifier design using greedy tree-structured vector quantization technique. 409-414 1997 18 Pattern Recognit. Lett. 5 https://doi.org/10.1016/S0167-8655(97)00036-6 https://www.wikidata.org/entity/Q126586958 db/journals/prl/prl18.html#HwangYL97

Ing-Yi Chen Wen-Jyi Hwang Sy-Yen Kuo Lin-Ying Lai Shi-Chiang Liao Chin-Tsai Lin Po-Yu Yeh