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L. Fernandez-Izquierdo

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2024
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Rodolfo A. Rodriguez-Davila, L. Fernandez-Izquierdo, J. Fink, T. Moise, Robert C. Baumann, Bruce Gnade, Manuel Quevedo-Lopez, Chadwin D. Young:
Reliability Assessment of a-IGZO and ZnO Thin Film Transistors (TFTs) to X-ray irradiation. IRPS 2024: 1-6

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