BibTeX records: A. Aubert

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@article{DBLP:journals/mr/AubertJPLF11,
  author       = {A. Aubert and
                  S{\'{e}}bastien Jacques and
                  S. P{\'{e}}tremont and
                  Nathalie Labat and
                  H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont},
  title        = {Experimental power cycling on insulated {TRIAC} package: Reliability
                  interpretation thanks to an innovative failure analysis flow},
  journal      = {Microelectron. Reliab.},
  volume       = {51},
  number       = {9-11},
  pages        = {1845--1849},
  year         = {2011},
  url          = {https://doi.org/10.1016/j.microrel.2011.07.071},
  doi          = {10.1016/J.MICROREL.2011.07.071},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/AubertJPLF11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/AubertRMLF10,
  author       = {A. Aubert and
                  J. P. Rebrasse and
                  Lionel Dantas de Morais and
                  Nathalie Labat and
                  H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont},
  title        = {Failure analysis case study on a Cu/low-k technology in package: New
                  front-side approach using laser and plasma de-processing},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {9-11},
  pages        = {1688--1691},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.07.036},
  doi          = {10.1016/J.MICROREL.2010.07.036},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/AubertRMLF10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/AubertMR08,
  author       = {A. Aubert and
                  Lionel Dantas de Morais and
                  J. P. Rebrasse},
  title        = {Laser decapsulation of plastic packages for failure analysis: Process
                  control and artefact investigations},
  journal      = {Microelectron. Reliab.},
  volume       = {48},
  number       = {8-9},
  pages        = {1144--1148},
  year         = {2008},
  url          = {https://doi.org/10.1016/j.microrel.2008.07.004},
  doi          = {10.1016/J.MICROREL.2008.07.004},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/AubertMR08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}