Automatic Thinning Detection through Image Segmentation Using Equivalent Array-Type Lamp-Based Lock-in Thermography.

Wontae Kim 0003 Kongju National University, Gongju, Korea https://orcid.org/0000-0002-9547-3868 https://www.wikidata.org/entity/Q101047295 Wontae Kim WonTae Kim Won-Tae Kim Won Tae Kim Wontae Kim 0001 Won-Tae Kim 0001 Korea University of Technology and Education (Koreatech University), Future Convergence Engineering Major, Department of Computer Science and Engineering, Cheonan, Korea Electronics and Telecommunications Research Institute (ETRI), Deajon, Korea https://orcid.org/0000-0003-3426-3792 https://www.wikidata.org/entity/Q61131039 https://ieeexplore.ieee.org/author/37086105200 Wontae Kim 0002 Seoul National University, Seoul, Korea LG Corporation, Seoul, Korea https://orcid.org/0009-0004-9008-1234 Wontae Kim 0004 Won-Tae Kim 0004 Samsung Electronics, Hwasung, Korea

Seungju Lee Yoonjae Chung Chunyoung Kim Wontae Kim 0003 Automatic Thinning Detection through Image Segmentation Using Equivalent Array-Type Lamp-Based Lock-in Thermography. 1281 2023 February 23 Sensors 3 https://doi.org/10.3390/s23031281 db/journals/sensors/sensors23.html#LeeCKK23

Yoonjae Chung Ranjit Shrestha Seungju Lee Wontae Kim 0003 Thermographic Inspection of Internal Defects in Steel Structures: Analysis of Signal Processing Techniques in Pulsed Thermography. 6015 2020 20 Sensors 21 https://doi.org/10.3390/s20216015 https://www.wikidata.org/entity/Q101047296 db/journals/sensors/sensors20.html#ChungSLK20

Yoonjae Chung Chunyoung Kim Seungju Lee Ranjit Shrestha