<?xml version="1.0"?>
<dblpperson name="Colin Bolger" pid="83/3789" n="1">
<person key="homepages/83/3789" mdate="2009-06-10">
<author pid="83/3789">Colin Bolger</author>
</person>
<r><inproceedings key="conf/dft/PengCKB04" mdate="2023-03-24">
<author pid="47/1103">Brian Peng</author>
<author pid="20/3822">Ing-Yi Chen</author>
<author pid="57/264">Sy-Yen Kuo</author>
<author pid="83/3789">Colin Bolger</author>
<title>IC HTOL Test Stress Condition Optimization.</title>
<pages>272-279</pages>
<year>2004</year>
<crossref>conf/dft/2004</crossref>
<booktitle>DFT</booktitle>
<ee>https://doi.ieeecomputersociety.org/10.1109/DFT.2004.33</ee>
<url>db/conf/dft/dft2004.html#PengCKB04</url>
</inproceedings>
</r>
<coauthors n="3" nc="1">
<co c="0"><na f="c/Chen:Ing=Yi" pid="20/3822">Ing-Yi Chen</na></co>
<co c="0"><na f="k/Kuo:Sy=Yen" pid="57/264">Sy-Yen Kuo</na></co>
<co c="0"><na f="p/Peng:Brian" pid="47/1103">Brian Peng</na></co>
</coauthors>
</dblpperson>

