"On Improving Transition Test Set Quality to Detect CMOS Transistor ..."

Xijiang Lin, Wu-Tung Cheng, Janusz Rajski (2015)

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DOI: 10.1109/ATS.2015.24

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Xijiang Lin, Wu-Tung Cheng, Janusz Rajski:
On Improving Transition Test Set Quality to Detect CMOS Transistor Stuck-Open Faults. ATS 2015: 97-102

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