"Sequential importance sampling for low-probability and high-dimensional ..."

Kentaro Katayama et al. (2010)

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DOI: 10.1109/ICCAD.2010.5654259

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-17

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Kentaro Katayama, Shiho Hagiwara, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato:
Sequential importance sampling for low-probability and high-dimensional SRAM yield analysis. ICCAD 2010: 703-708

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