Texture inspection for defects using neural networks and support vector machines.

Ajay Kumar 0001 Helen C. Shen Texture inspection for defects using neural networks and support vector machines. 353-356 2002 conf/icip/2002 ICIP (3) db/conf/icip/icip2002-3.html#KumarS02 https://doi.org/10.1109/ICIP.2002.1038978