Analysis of pattern-dependent and timing-dependent failures in an experimental test chip.

Jonathan T.-Y. Chang Chao-Wen Tseng Chien-Mo James Li Mike Purtell Edward J. McCluskey Analysis of pattern-dependent and timing-dependent failures in an experimental test chip. 184-193 1998 conf/itc/1998 ITC https://doi.org/10.1109/TEST.1998.743151 https://doi.ieeecomputersociety.org/10.1109/TEST.1998.743151 db/conf/itc/itc1998.html#ChangTLPM98