A process tolerant semi-self impedance calibration method for LPDDR4 memory controller.

Ho Joon Lee Yong-Bin Kim A process tolerant semi-self impedance calibration method for LPDDR4 memory controller. 1-4 2015 MWSCAS https://doi.org/10.1109/MWSCAS.2015.7282070 conf/mwscas/2015 db/conf/mwscas/mwscas2015.html#LeeK15