Empirical knowledge-driven remaining useful life prediction method under unknown failure pattern.

Jiaxian Chen Shuhan Deng Guolin He Zhuyun Chen 0001 Weihua Li 0004 Empirical knowledge-driven remaining useful life prediction method under unknown failure pattern. 104291 2026 71 Adv. Eng. Informatics https://doi.org/10.1016/j.aei.2025.104291 db/journals/aei/aei71.html#ChenDHCL26 streams/journals/aei