BibTeX record journals/ieicet/SumiMKH05

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@article{DBLP:journals/ieicet/SumiMKH05,
  author       = {Takeshi Sumi and
                  Osamu Mizuno and
                  Tohru Kikuno and
                  Masayuki Hirayama},
  title        = {An Effective Testing Method for Hardware Related Fault in Embedded
                  Software},
  journal      = {{IEICE} Trans. Inf. Syst.},
  volume       = {88-D},
  number       = {6},
  pages        = {1142--1149},
  year         = {2005},
  url          = {https://doi.org/10.1093/ietisy/e88-d.6.1142},
  doi          = {10.1093/IETISY/E88-D.6.1142},
  timestamp    = {Mon, 26 Jun 2023 20:52:16 +0200},
  biburl       = {https://dblp.org/rec/journals/ieicet/SumiMKH05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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