Power efficient charge pump in deep submicron standard CMOS technology.

Roberto Pelliconi David Iezzi Andrea Baroni Marco Pasotti Pier Luigi Rolandi Power efficient charge pump in deep submicron standard CMOS technology. 1068-1071 2003 38 IEEE J. Solid State Circuits 6 https://doi.org/10.1109/JSSC.2003.811991 db/journals/jssc/jssc38.html#PelliconiIBPR03