"Determination of the thermal resistance and current exponent of ..."

R. Petersen et al. (2001)

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DOI: 10.1016/S0026-2714(01)00195-0

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type: Journal Article

metadata version: 2025-01-19

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R. Petersen, Ward De Ceuninck, Luc De Schepper, Olivier Vendier, Hervé Blanck, Dominique Pons:
Determination of the thermal resistance and current exponent of heterojunction bipolar transistors for reliability evaluation. Microelectron. Reliab. 41(9-10): 1591-1596 (2001)

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