<?xml version="1.0" encoding="US-ASCII"?>
<dblp>
<inproceedings key="conf/islped/KeshavarziSTMBTZLHDBD05" mdate="2024-04-30">
<author>Ali Keshavarzi</author>
<author>Gerhard Schrom</author>
<author>Stephen Tang</author>
<author>Sean Ma</author>
<author>Keith A. Bowman</author>
<author>Sunit Tyagi</author>
<author>Kevin Zhang 0001</author>
<author>Tom Linton</author>
<author>Nagib Hakim</author>
<author>Steven G. Duvall</author>
<author>John Brews</author>
<author>Vivek De</author>
<title>Measurements and modeling of intrinsic fluctuations in MOSFET threshold voltage.</title>
<pages>26-29</pages>
<year>2005</year>
<crossref>conf/islped/2005</crossref>
<booktitle>ISLPED</booktitle>
<ee>https://doi.org/10.1145/1077603.1077611</ee>
<url>db/conf/islped/islped2005.html#KeshavarziSTMBTZLHDBD05</url>
</inproceedings>
</dblp>
