RT8108: Synchronous Buck Controller
RT8108: Synchronous Buck Controller
CHF CBULK
RT8108x
VCC 5 VCC RBOOT CBOOT
5V or 12V BOOT 1
CDCPL 2
UGATE LOUT
RUGATE
8
7 COMP PHASE VOUT
/SD
LGATE/ 4 R COUT
RF OCSET
6
C1 FB 3
GND C
EN CF RS
ROFFSET ROCSET
Delay
5V
Sample DBOOT
- POR and Internal
and Hold BOOT
Soft-Start Regulator
+
OC
IOCSET Comparator UGATE
5V int.
VREF -1 PHASE
(0.6V / 0.8V)
PWM
Comparator INHIBIT
+ Gate Control
EA +
FB - Logic
- PWM
0.2V + DIS
VCC
- DIS
LGATE/OCSET
COMP/SD Oscillator
GND
Fixed 200kHz / 300kHz / 500kHz
Electrical Characteristics
(VCC = 12V, TA = 25°C, unless otherwise specified)
Note 1. Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of the device at these or any other conditions beyond those
indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
Note 2. θJA is measured in the natural convection at TA = 25°C on a high effective thermal conductivity test board (4 Layers, 2S2P)
of JEDEC 51-7 thermal measurement standard. The case point of θJC is on the exposed pad of the package.
Note 3. Devices are ESD sensitive. Handling precaution is recommended.
Note 4. The device is not guaranteed to function outside its operating conditions.
.
60 1.202
50
40 1.198
30
20 1.194
10
VIN = VCC = 12V VIN = VCC = 12V
0 1.190
0 5 10 15 20 25 30 0 5 10 15 20 25
Load Current (A) Load Current (A)
0.604
Reference Voltage (V)
350
0.603
Frequency (kHz)11
0.602 300
0.601
0.600 250
0.599
200
0.598
VIN = VCC = 12V, No Load VIN = VCC = 12V, No Load
0.597 150
-50 -25 0 25 50 75 100 125 -50 -25 0 25 50 75 100 125
Temperature (°C) Temperature (°C)
VOUT VOUT
(1V/Div) (1V/Div)
VIN VIN
(10V/Div) (10V/Div)
V CC V CC
(10V/Div) (10V/Div)
UGATE UGATE
(20V/Div) (20V/Div)
VIN = VCC = 12V, No Load VIN = VCC = 12V, No Load
VCOMP
VCOMP (1V/Div)
(1V/Div)
VOUT
(1V/Div) VOUT
(1V/Div)
UGATE UGATE
(20V/Div) (20V/Div)
LGATE LGATE
(10V/Div) (10V/Div)
VIN = VCC = 12V, No Load VIN = VCC = 12V, No Load
Time (1ms/Div) Time (20ms/Div)
VOUT_ac VOUT_ac
(50mV/Div) (50mV/Div)
UGATE UGATE
(20V/Div) (20V/Div)
I LOAD I LOAD
(10A/Div) (10A/Div)
IL VFB
(10A/Div) (1V/Div)
VOUT VOUT
(1V/Div) (1V/Div)
UGATE
UGATE (20V/Div)
(20V/Div)
LGATE LGATE
(10V/Div) (10V/Div)
VCC = 12V, IOCSET = 15A VIN = VCC = 12V, No Load
Time (10ms/Div) Time (20ms/Div)
Gain (dB)
2π × ESR × COUT 0
0
Modulator
2) Compensator -20 Gain
Layout Considerations
FB
PCB layout is critical to high-current high-frequency
-
COMP
EA
+ switching converter designs. A good layout can help the
RF
V REF controller to function properly and achieve expected
performance. On the other hand, PCB without a carefully
Figure 4. Type II Compensator layout can radiate excessive noise, having more power
loss and even malfunction in the controller. In order to avoid
Type II compensator provides two poles and one zero to the above condition, the following general guidelines must
the system. The first pole is located at low frequency to be followed in PCB layout.
increase the dc gain for regulation accuracy. The location
` Power stage components should be placed first. Place
of the other pole and the zero is expressed as follows.
the input bulk capacitors close to the high-side power
fZ1 = 1
2π × R2 × C2 MOSFETs, and then locate the output inductor and finally
the output capacitors.
fP1 = 1
2π × R2 × C1× C2 ` Place the ceramic capacitor physically close to the drain
C1+ C2
of the high-side MOSFET. This can reduce the input
Figure 5 shows the Bode plot for the gain of system. The
voltage drop when high-side MOSFET is turned on. If
compensation gain determined by ZC and ZF should be
more than one MOSFET is paralleled, each should have
designed to have high crossover frequency (bandwidth) with
its own individual ceramic capacitor.
sufficient phase margin. In order to make the gain crosses
over 0dB at a slope of −20dB/dec, place the zero before ` Keep the high-current loops as short as possible. During
the LC double-pole frequency. Empirically, fz1 is placed at high speed switching, the current transition between
75% of the LC double-pole frequency. Furthermore, the MOSFETs usually causes di/dt voltage spike due to the
bandwidth of the system is the factor that affects the parasitic components on PCB trace. Therefore, making
converter's transient performance. High bandwidth results the trace length between power MOSFETs and inductors
in fast transient response, but it often jeopardizes the wide and short can reduce the voltage spike and EMI.
system stability. The bandwidth should be designed to be ` Make MOSFET gate driver path as short as possible.
less than 1/5 of the switching frequency. Properly adjust Since the gate driver uses narrow-width high-current
R1 and R2 to change the mid-frequency gain to obtain the pulses to switch on/off the power MOSFET, the driver
required bandwidth. The pole at fp1 is usually placed at half path must be short to reduce the trace inductance. This
of the switching frequency to have sufficient phase margin is especially important for low-side MOSFET, because
and attenuation at high frequency. this can reduce the possibility of shoot-through.
H
A
J B
C
I
D
C
I
D
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