"Optimization of Built-In Self-Test test chain configuration in 2.5D ..."

Zhe Yang et al. (2025)

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DOI: 10.1016/J.ENGAPPAI.2024.109876

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type: Journal Article

metadata version: 2025-05-15

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Zhe Yang, Libao Deng, Chunlei Li, Lili Zhang:
Optimization of Built-In Self-Test test chain configuration in 2.5D Integrated Circuits Using Constrained Multi-Objective Evolutionary Algorithm. Eng. Appl. Artif. Intell. 143: 109876 (2025)

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